Publication:
Two stages fault detection method based on error, applied in EBM facility

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dc.Conferencecode130887
dc.Conferencedate8 August 2016 through 10 August 2016
dc.Conferencename7th International Nuclear Science, Technology and Engineering Conference 2016, NuSTEC 2016
dc.contributor.affiliationsFaculty of Engineering and Built Environment
dc.contributor.affiliationsUniversiti Tenaga Nasional (UNITEN)
dc.contributor.affiliationsUniversiti Sains Islam Malaysia (USIM)
dc.contributor.authorGhazali A.B.en_US
dc.contributor.authorHasan A.B.en_US
dc.date.accessioned2024-05-28T08:33:05Z
dc.date.available2024-05-28T08:33:05Z
dc.date.issued2017
dc.description.abstractData driven technique is a well-known method in fault detection and it is suitable for large industrial systems. In this article, this technique is applied in an electron beam (EB) facility to assist the technology available in that facility so that the number and cost of equipment/component failures can be reduced. An example is on EB scanning, if not properly monitored and in case of beam scanning unit fails, it will damage EB accelerator tube which is one of the main components in EBM facility. For these two stages fault detection, the current data for both x- & y- coils are monitored and compared with the normal outputs that obtained from such as an ANFIS model. If either or both errors are larger than their threshold limits and it happened for a certain period of time then the beam current source shall be terminated and the high voltage power supply across the tube shall be quickly reduce to 0 kV in order to avoid heat developed on the 25 ?m titanium foil window that due to electron beam penetration and will soon torn the window. Delays for three cases (x-, y- and both x&y coils) are pre-determined by the specialist and these will eliminate uncertainty of error signals.
dc.description.natureFinalen_US
dc.editorHamid M.N.A.Mohamed A.A.Idris F.M.Husin A.H.en_US
dc.identifier.ArtNo50003
dc.identifier.doi10.1063/1.4972937
dc.identifier.isbn9780740000000
dc.identifier.issn0094243X
dc.identifier.scopus2-s2.0-85031297306
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85031297306&doi=10.1063%2f1.4972937&partnerID=40&md5=4b2fd97fb6e691c64aa5a105f9ac0225
dc.identifier.urihttps://oarep.usim.edu.my/handle/123456789/9045
dc.identifier.volume1799
dc.languageEnglish
dc.language.isoen_US
dc.publisherAmerican Institute of Physics Inc.en_US
dc.relation.ispartofAIP Conference Proceedings
dc.sourceScopus
dc.subjectAdaptive neuro-fuzzy inference system (ANFIS)en_US
dc.subjectBoolean comparator with delayen_US
dc.subjectData driven technique for fault detectionen_US
dc.subjectElectron beam scanningen_US
dc.subjectHigh voltage power supplyen_US
dc.titleTwo stages fault detection method based on error, applied in EBM facility
dc.typeConference Paperen_US
dspace.entity.typePublication

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