Publication:
Optical measurements on tailored zinc oxide thin films under optimal

Simple item page
dc.contributor.authorR. Haarindraprasaden_US
dc.contributor.authorU. Hashimen_US
dc.contributor.authorSubash C.B. Gopinathen_US
dc.contributor.authorP. Veeradasanen_US
dc.contributor.authorWei-Wen Liuen_US
dc.contributor.authorB. Sharma Raoen_US
dc.contributor.authorV. Thivina,en_US
dc.date.accessioned2024-05-28T05:45:48Z
dc.date.available2024-05-28T05:45:48Z
dc.date.issued2016
dc.descriptionOptik Volume 127, Issue 5, March 2016, Pages 3069-3074en_US
dc.description.abstractZnO is synthesized by using conventional chemical route which is known as the “sol – gel” method and deposited on glass and silicon substrate. Morphological and optical properties have been investigated using XRD, AFM, FESEM and UV – vis test. In order to optimize the synthesized ZnO thin film, the ZnO thin film is coated with thin film of different thickness associated with various annealing temperature. Thicknesses of ZnO thin film coated for 3, 5 and 9 coating cycles of coating are 40 nm2, 60 nm2 and 200 nm2, respectively. The data report that the grain size of the seed solution increases from 80 nm to 110 nm as the thickness of ZnO thin film increases. As the thin film is treated with annealing temperature from 200 °C to 450 °C, the grain size of thin film also increases from 100 nm2 to 450 nm2. The RMS value of thin film also increases due to intense surface roughness on ZnO thin film. The band gap value of thin film decreased from 3.26 eV to 3.18 eV for coating ZnO thin film with thickness 40 nm2 – 200 nm2.en_US
dc.identifier.citationR. Haarindraprasad, U. Hashim, Subash C.B. Gopinath, P. Veeradasan, Wei-Wen Liu, B. Sharma Rao, V. Thivina, Optical measurements on tailored zinc oxide thin films under optimal, Optik, Volume 127, Issue 5, 2016, Pages 3069-3074, ISSN 0030-4026, https://doi.org/10.1016/j.ijleo.2015.12.052.en_US
dc.identifier.doi10.1016/j.ijleo.2015.12.052
dc.identifier.urihttps://oarep.usim.edu.my/handle/123456789/6399
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofOptiken_US
dc.subjectZnO, Thin film, XRD, UV – vis, Grain size, Band gapen_US
dc.titleOptical measurements on tailored zinc oxide thin films under optimalen_US
dc.typeArticleen_US
dspace.entity.typePublication

Files

Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
Optical measurements on tailored zinc oxide thin films under optimal.pdf
Size:
1.52 MB
Format:
Adobe Portable Document Format
Download
License bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
1.71 KB
Format:
Plain Text
Description:
Download

Collections

Other Publications