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The photochemistry of Cr(CO)6 in high pressure low temperature polymer matrix monitored by fourier transform infrared and UV-vis spectroscopy

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dc.contributor.affiliationsFaculty of Science and Technology
dc.contributor.affiliationsUniversiti Sains Islam Malaysia (USIM)
dc.contributor.authorHarun F.W.en_US
dc.date.accessioned2024-05-28T08:25:44Z
dc.date.available2024-05-28T08:25:44Z
dc.date.issued2016
dc.description.abstractThe aim of this work is to develop a new type of polymer matrix which can be used to study the reactive intermediates produced from UV photolysis of metal carbonyl complexes measured with FTIR as well as UV-vis spectroscopy. The photochemistry of Cr(CO)6impregnated in Teflon-AF polymer with the presence of N2, CH4and even weak ligand i.e.Xe and He were conducted at extremely low temperature. Photolysis of Cr(CO)6under N2environment produces up to four carbonyl groups being replaced with the N2. Meanwhile, the photochemistry of Cr(CO)6under Xe and CH4produce the reactive complexes of Cr(CO)5(Xe) and Cr(CO)5(CH4)respectively. Teflon-AF was found to be the suitable matrix material as the �C�F� bond binds very weakly to the metal center. � 2016 Penerbit UTM Press. All rights reserved.
dc.description.natureFinalen_US
dc.identifier.doi10.11113/jt.v78.8977
dc.identifier.epage73
dc.identifier.issn1279696
dc.identifier.issue6-Apr
dc.identifier.scopus2-s2.0-84975045831
dc.identifier.spage67
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84975045831&doi=10.11113%2fjt.v78.8977&partnerID=40&md5=d0145f4af3ceae9db345aba14a5ad24f
dc.identifier.urihttps://oarep.usim.edu.my/handle/123456789/8675
dc.identifier.volume78
dc.languageEnglish
dc.language.isoen_USen_US
dc.publisherPenerbit UTM Pressen_US
dc.relation.ispartofJurnal Teknologi
dc.sourceScopus
dc.subjectFTIRen_US
dc.subjectMatrix isolationen_US
dc.subjectTeflon-AFen_US
dc.subjectUV-vis spectroscopyen_US
dc.titleThe photochemistry of Cr(CO)6 in high pressure low temperature polymer matrix monitored by fourier transform infrared and UV-vis spectroscopyen_US
dc.title.alternativeJ. Teknol.en_US
dc.typeArticleen_US
dspace.entity.typePublication

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