Publication: Kretschmann based surface plasmon resonance for sensing in visible region
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Date
2019
Journal Title
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Volume Title
Publisher
Institute of Electrical and Electronics Engineers Inc.
Abstract
Kretschmann-based surface plasmon resonance (K-SPR) sensing approach using planar thin metal films offer distinct advantages over other label-free sensing techniques in the visible region. SPR phenomenon occurs due to the propagation of electromagnetic waves along the surface of the thin metal layers. Practically, some refractive index changes on the dielectric sample layer will cause changes in surface plasmon polaritons (SPP). The main purpose of using this coupling technique is to match the light-wave vector wave with the SPP vector wave. This paper will give an overview of the design and development of SPR-based sensors utilizing the angular interrogation Kretschmann configuration for detecting the presence of various analytes such as urea, creatinine, glucose, ethanol and uric acid in the visible region. Various sensor layers such as 50-nm thick gold (Au), MoS2/graphene, Au/graphene oxide, Ag/ITO and Au/Ag/ZnO thin films were used to detect the analytes at 633 nm, 670 nm and 785 nm visible electromagnetic wavelengths. Output characteristics such as the reflectivity, full width at half maximum (FWHM), sensitivity, Q factor and Figure of merit (FOM) of the sensors were analyzed. Results of this study was obtained using Lumerical's Finite Difference Time Domain (FDTD) and experimental characterization was obtained using Bionavis SPR equipment; available at IMEN, UKM. � 2019 IEEE.
Description
Keywords
Conducting metal oxides (TMO), Graphene, Graphene oxide, Kretschmann, Metal oxide, Sensor, Surface plasmon resonance (SPR), Transition metal dichalcogenide (TMD), Visible wavelength, Electromagnetic wave polarization, Electromagnetic wave propagation, Electromagnetic waves, Finite difference time domain method, Gold compounds, Graphene, Graphene oxide, Layered semiconductors, Molybdenum compounds, Nanoelectronics, Oxide films, Plasmons, Q factor measurement, Refractive index, Sensors, Time domain analysis, Transition metals, Urea, Conducting metal oxides, Kretschmann, Metal oxides, Transition metal dichalcogenides, Visible wavelengths, Surface plasmon resonance